Documentos Técnicos
Especificações
Brand
NexperiaDiode Configuration
Complex Array
Product Type
TVS Diode Array
Direction Type
Bi-Directional
Minimum Breakdown Voltage Vbr
6V
Mount Type
Surface
Package Type
SOT-457 (SC-74)
Pin Count
6
Minimum Operating Temperature
-55°C
Test Current It
1mA
ESD Protection
Yes
Number of Elements per Chip
4
Maximum Operating Temperature
150°C
Width
1.7 mm
Height
1.1mm
Length
3.1mm
Standards/Approvals
No
Series
PRTR
Maximum Reverse Leakage Current
100nA
Automotive Standard
AEC-Q101
País de Origem
China
Detalhes do produto
PRTR5V0U Series, Ultra Low Capacitance Rail-to-Rail ESD Protection Diodes, Nexperia
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.
Transient Voltage Suppressors, Nexperia
Informações de estoque temporariamente indisponíveis.
R$ 9.780,00
R$ 3,26 Each (On a Reel of 3000) (Sem VAT)
3000
R$ 9.780,00
R$ 3,26 Each (On a Reel of 3000) (Sem VAT)
Informações de estoque temporariamente indisponíveis.
3000
Documentos Técnicos
Especificações
Brand
NexperiaDiode Configuration
Complex Array
Product Type
TVS Diode Array
Direction Type
Bi-Directional
Minimum Breakdown Voltage Vbr
6V
Mount Type
Surface
Package Type
SOT-457 (SC-74)
Pin Count
6
Minimum Operating Temperature
-55°C
Test Current It
1mA
ESD Protection
Yes
Number of Elements per Chip
4
Maximum Operating Temperature
150°C
Width
1.7 mm
Height
1.1mm
Length
3.1mm
Standards/Approvals
No
Series
PRTR
Maximum Reverse Leakage Current
100nA
Automotive Standard
AEC-Q101
País de Origem
China
Detalhes do produto
PRTR5V0U Series, Ultra Low Capacitance Rail-to-Rail ESD Protection Diodes, Nexperia
Ultra Low Capacitance Rail-to-Rail ElectroStatic Discharge (ESD) protection device in a small Surface-Mounted Device (SMD) plastic package.
The device is designed to protect High-Speed data lines or High-Frequency signal lines from the damage caused by ESD and other transients.


